会議情報
IIRW 2016: IEEE International Integrated Reliability Workshop
http://www.iirw.org提出日: |
2016-07-25 Extended |
通知日: |
|
会議日: |
2016-10-09 |
場所: |
Stanford Sierra, California, USA |
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論文募集
Scope We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: Designing-in reliability (products, circuits, systems, processes) Resistive memory: degradation mechanisms Deep sub-micron transistor and circuit reliability Customer product reliability requirements / manufacturer reliability tasks Root cause defects, physical mechanisms, and simulations Wafer level reliability tests, test approaches, and reliability test structures Abstract Submission Please prepare your two-page extended abstract (maximum two pages including figures) in pdf format, and submit it to the following URL: https://easychair.org/conferences/?conf=iirw2016 Please follow the IEEE template when preparing your abstract. All submissions will be acknowledged by email within one week. If you do not receive acknowledgement of your submission, please contact the Technical Program Chair. Your abstract should state clearly and concisely the results of your work and why they are significant. Representative data and figures that support your proposal are REQUIRED. Additional Information For further information please contact the Technical Program Chair: Tom Kopley, Fairchild Email: tpc.iirw2016@gmail.com
最終更新 Xin Yao 2016-07-24
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関連仕訳帳
CCF | 完全な名前 | インパクト ・ ファクター | 出版社 | ISSN |
---|---|---|---|---|
Virtual Reality | 0.341 | Springer | 1359-4338 | |
b | Software Testing, Verification and Reliability | 0.762 | John Wiley & Sons, Ltd | 1099-1689 |
Software Testing Verification and Reliability | 1.171 | Wiley-Blackwell | 0960-0833 | |
Nano Communication Networks | 2.947 | Elsevier | 1878-7789 | |
Journal of Internet Security | DDSecure.Net Inc. | 1206-4890 | ||
Integrated Computer-Aided Engineering | 4.904 | IOS Press | 1069-2509 | |
Information Polity | IOS Press | 1570-1255 | ||
Physics of Life Reviews | 11.02 | Elsevier | 1571-0645 | |
ACM Journal of Data and Information Quality | ACM | 1936-1955 | ||
Industrial Robot | 1.190 | Emerald | 0143-991X |
完全な名前 | インパクト ・ ファクター | 出版社 |
---|---|---|
Virtual Reality | 0.341 | Springer |
Software Testing, Verification and Reliability | 0.762 | John Wiley & Sons, Ltd |
Software Testing Verification and Reliability | 1.171 | Wiley-Blackwell |
Nano Communication Networks | 2.947 | Elsevier |
Journal of Internet Security | DDSecure.Net Inc. | |
Integrated Computer-Aided Engineering | 4.904 | IOS Press |
Information Polity | IOS Press | |
Physics of Life Reviews | 11.02 | Elsevier |
ACM Journal of Data and Information Quality | ACM | |
Industrial Robot | 1.190 | Emerald |
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