Información de la conferencia
IIRW 2016: IEEE International Integrated Reliability Workshop
http://www.iirw.orgDía de Entrega: |
2016-07-25 Extended |
Fecha de Notificación: |
|
Fecha de Conferencia: |
2016-10-09 |
Ubicación: |
Stanford Sierra, California, USA |
Vistas: 7968 Seguidores: 0 Asistentes: 0
Solicitud de Artículos
Scope We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: Designing-in reliability (products, circuits, systems, processes) Resistive memory: degradation mechanisms Deep sub-micron transistor and circuit reliability Customer product reliability requirements / manufacturer reliability tasks Root cause defects, physical mechanisms, and simulations Wafer level reliability tests, test approaches, and reliability test structures Abstract Submission Please prepare your two-page extended abstract (maximum two pages including figures) in pdf format, and submit it to the following URL: https://easychair.org/conferences/?conf=iirw2016 Please follow the IEEE template when preparing your abstract. All submissions will be acknowledged by email within one week. If you do not receive acknowledgement of your submission, please contact the Technical Program Chair. Your abstract should state clearly and concisely the results of your work and why they are significant. Representative data and figures that support your proposal are REQUIRED. Additional Information For further information please contact the Technical Program Chair: Tom Kopley, Fairchild Email: tpc.iirw2016@gmail.com
Última Actualización Por Xin Yao en 2016-07-24
Conferencias Relacionadas
Abreviación | Nombre Completo | Entrega | Conferencia |
---|---|---|---|
SISAP | International Conference on Similarity Search and Applications | 2020-05-01 | 2020-09-30 |
SafeComp | International Conference on Computer Safety, Reliability and Security | 2024-02-04 | 2024-09-17 |
IRI | International Conference on Information Reuse & Integration for Data Science | 2023-05-08 | 2023-08-04 |
ACITY | International Conference on Advances in Computing and Information technology | 2022-12-10 | 2022-12-23 |
IC3e | IEEE Conference on e-Learning, e-Management and e-Services | 2020-07-31 | 2020-11-17 |
SIELA | International Symposium on Electrical Apparatus and Technologies | 2024-02-15 | 2024-06-12 |
IPTPS | International workshop on Peer-To-Peer Systems | 2010-04-27 | |
CP | International Conference on Principles and Practice of Constraint Programming | 2024-04-18 | 2024-09-02 |
CONIT | International Conference on Intelligent Technologies | 2023-04-30 | 2023-06-23 |
NM&A | International Conference on Numerical Methods and Applications | 2010-08-20 |
Revistas Relacionadas
CCF | Nombre Completo | Factor de Impacto | Editor | ISSN |
---|---|---|---|---|
Virtual Reality | 0.341 | Springer | 1359-4338 | |
b | Software Testing, Verification and Reliability | 0.762 | John Wiley & Sons, Ltd | 1099-1689 |
Software Testing Verification and Reliability | 1.171 | Wiley-Blackwell | 0960-0833 | |
Nano Communication Networks | 2.947 | Elsevier | 1878-7789 | |
Journal of Internet Security | DDSecure.Net Inc. | 1206-4890 | ||
Integrated Computer-Aided Engineering | 4.904 | IOS Press | 1069-2509 | |
Information Polity | IOS Press | 1570-1255 | ||
Physics of Life Reviews | 11.02 | Elsevier | 1571-0645 | |
ACM Journal of Data and Information Quality | ACM | 1936-1955 | ||
Industrial Robot | 1.190 | Emerald | 0143-991X |
Nombre Completo | Factor de Impacto | Editor |
---|---|---|
Virtual Reality | 0.341 | Springer |
Software Testing, Verification and Reliability | 0.762 | John Wiley & Sons, Ltd |
Software Testing Verification and Reliability | 1.171 | Wiley-Blackwell |
Nano Communication Networks | 2.947 | Elsevier |
Journal of Internet Security | DDSecure.Net Inc. | |
Integrated Computer-Aided Engineering | 4.904 | IOS Press |
Information Polity | IOS Press | |
Physics of Life Reviews | 11.02 | Elsevier |
ACM Journal of Data and Information Quality | ACM | |
Industrial Robot | 1.190 | Emerald |
Recomendaciones