# Russian Microelectronics

- **Publisher**: Springer
- **ISSN**: 1063-7397
- **Trackers**: 0
- **Canonical page**: https://www.myhuiban.com/journal/537

## Call for papers

Aims and scope Russian Microelectronics is a peer-reviewed journal devoted to technological, physical, and circuit engineering aspects of micro- and nanoelectronics. Special attention is paid to new trends in lithography (optical, X-ray, electron, ion), etching, doping, deposition, and planarization at the submicron and nanometer scales. The journal also encompasses an array of topics, including beam and plasma technologies, molecular beam epitaxy and dry etching; the methods of study and control of surfaces and multilayer structures; mathematical modeling and real-time diagnostics of technological processes; semiconductor devices based on new physical principles, such as quantum dimensional effects and superconductivity; heterostructures, nanotransistors, and semiconductor implementations of quantum bits (qubits). The journal publishes original manuscripts submitted in English, as well as works translated from several other journals. The sources of content are indicated at the article level. The peer review policy of the journal is independent of the manuscript source, ensuring a fair and unbiased evaluation process for all submissions. As part of its aim to become an international publication, the journal welcomes submissions in English from all countries.

## Related conferences

- MicroCom — International Conference on Microelectronics, Computing and Communication — https://www.myhuiban.com/conference/1823
- SBMicro — Symposium on Microelectronics Technology and Devices — https://www.myhuiban.com/conference/1710
- MDTS — Microelectronics Design and Test Symposium — https://www.myhuiban.com/conference/4072
- ICoMN — International Conference on Microelectronics and Nanoelectronics — https://www.myhuiban.com/conference/3825
- ICMACC — International Conference on recent trends in Microelectronics, Automation, Computing and Communications Systems — https://www.myhuiban.com/conference/4859

## Related journals

- Microelectronics Journal — https://www.myhuiban.com/journal/405
- Microelectronics Reliability — https://www.myhuiban.com/journal/404
- Computing — https://www.myhuiban.com/journal/470
- Networking Science — https://www.myhuiban.com/journal/47
- Information Technology and Management — https://www.myhuiban.com/journal/128

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Source: Conference Partner — https://www.myhuiban.com/journal/537 (rankings reproduced from CCF / ICORE / QUALIS; data cached up to 1 hour)