# Microelectronics Reliability

- **Publisher**: Elsevier
- **ISSN**: 0026-2714
- **Impact factor**: 1.9
- **Trackers**: 5
- **Canonical page**: https://www.myhuiban.com/journal/404

## Call for papers

Aims & Scope Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. All contributions are subject to peer review by leading experts in the field. Special issues are devoted to significant international conferences, or to important developing topics. Microelectronics Reliability is an indispensable forum for the exchange of knowledge and experience between microelectronics reliability professionals from both academic and industrial environments, and all those associated in any way with a steadily growing microelectronics industry and its many fields of application.

## Related conferences

- MicroCom — International Conference on Microelectronics, Computing and Communication — https://www.myhuiban.com/conference/1823
- SBMicro — Symposium on Microelectronics Technology and Devices — https://www.myhuiban.com/conference/1710
- MDTS — Microelectronics Design and Test Symposium — https://www.myhuiban.com/conference/4072
- ICoMN — International Conference on Microelectronics and Nanoelectronics — https://www.myhuiban.com/conference/3825
- ICMACC — International Conference on recent trends in Microelectronics, Automation, Computing and Communications Systems — https://www.myhuiban.com/conference/4859

## Related journals

- Microelectronics Journal — https://www.myhuiban.com/journal/405
- IEEE Transactions on Reliability — https://www.myhuiban.com/journal/1104
- Russian Microelectronics — https://www.myhuiban.com/journal/537
- Engineering — https://www.myhuiban.com/journal/764
- Software Testing Verification and Reliability — https://www.myhuiban.com/journal/835

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Source: Conference Partner — https://www.myhuiban.com/journal/404 (rankings reproduced from CCF / ICORE / QUALIS; data cached up to 1 hour)