# IEEE Design & Test

- **Publisher**: IEEE
- **ISSN**: 2168-2356
- **Impact factor**: 1.9
- **Trackers**: 0
- **Canonical page**: https://www.myhuiban.com/journal/1162

## Call for papers

Aims & Scope IEEE Design & Test offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards.

## Related conferences

- IDT — IEEE International Design & Test Symposium — https://www.myhuiban.com/conference/1818
- DTS — IEEE international conference on Design & Test of integrated micro & nano-Systems — https://www.myhuiban.com/conference/3173
- IEEE S&B — IEEE Security & Privacy on the Blockchain Workshop — https://www.myhuiban.com/conference/4100
- VDAT — International Symposium on VLSI Design and Test — https://www.myhuiban.com/conference/5482
- MDTS — Microelectronics Design and Test Symposium — https://www.myhuiban.com/conference/4072

## Related journals

- IEEE Computer — https://www.myhuiban.com/journal/321
- IEEE Software — https://www.myhuiban.com/journal/565
- IEEE Intelligent Systems — https://www.myhuiban.com/journal/180
- IEEE Network — https://www.myhuiban.com/journal/342
- IEEE MultiMedia — https://www.myhuiban.com/journal/147

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Source: Conference Partner — https://www.myhuiban.com/journal/1162 (rankings reproduced from CCF / ICORE / QUALIS; data cached up to 1 hour)