# IOLTS — IEEE International Symposium on On-Line Testing and Robust System Design

- **Submission deadline**: 2026-02-15
- **Notification date**: 2026-04-12
- **Conference date**: 2026-07-01
- **Location**: Polignano a Mare, Italy
- **Rankings**: CORE C
- **Conference Partner Index**: 55.2/100 (ranked #829, confidence 0.80, algorithm 1.1) — how this is computed: https://www.myhuiban.com/ranking
- **Trackers**: 0
- **Attendees**: 0
- **Canonical page**: https://www.myhuiban.com/conference/5021

## Call for papers

You are invited to participate and submit your contributions to IOLTS’26. The areas of interest include (but are not limited to) the following topics: Dependable system design Dependable Computer Architectures Design-for-Reliability Design for Reliability approaches for Low-Power Cross-layer reliability approaches Fault-Tolerant and Fail-Safe systems Functional safety Self-Test and Self-Repair Self-Healing design Self-Regulating design Self-Adapting design Reliability issues of Low-Power Design Robustness evaluation Quality, yield, reliability, and lifespan issues in nanometer technologies Variability, Aging, EMI, and Radiation Effects in nanometer technologies On-line testing techniques for digital, analog, and mixed-signal circuits Self-checking circuits and coding theory On-line monitoring of current, temperature, process variations, and aging Power density and overheating issues in nanometer technologies Field Diagnosis, Maintainability, and Reconfiguration Design for Security Fault-based attacks and countermeasures Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular, and satellite communications CAD for robust circuits design

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Source: Conference Partner — https://www.myhuiban.com/conference/5021 (rankings reproduced from CCF / ICORE / QUALIS; data cached up to 1 hour)