# DTS — IEEE international conference on Design & Test of integrated micro & nano-Systems

- **Submission deadline**: 2019-02-04
- **Notification date**: 2019-03-12
- **Conference date**: 2019-04-28
- **Location**: Gammarth, Tunisia
- **Conference Partner Index**: 42.1/100 (ranked #4137, confidence 0.25, algorithm 1.1) — how this is computed: https://www.myhuiban.com/ranking
- **Trackers**: 0
- **Attendees**: 1
- **Canonical page**: https://www.myhuiban.com/conference/3173

## Call for papers

Systems Design & Technology (SDT) : Analog, digital, mixed, and RF circuits design SoC, MPSoC, NoC, SIP, and NIP design Embedded electronics and System architecture MEMS, NEMS and MOEMS systems design Low-power electronics and systems design Sensory Systems Design Wireless communication systems design Opto-electronic System Design Biomedical Circuit & Systems Bio-engineering & Bio-chip design Linear & Non-Linear Circuits Power electronics and systems design Hardware co-design & FPGA design VLSI systems circuit and design DSPs and multiprocessor systems Embedded systems for Deep Learning Control Systems & Mechatronics Algorithms, methods and tools for modeling, simulation, synthesis and verification of ICs Algorithms, methods and tools for signal processing and image processing Algorithms, methods and tools for information security and cryptography Artificial Intelligence systems Electronic systems for energy harvesting applications GPS based engineering systems Process technologies, CMOS, BiCMOS, GaAs Microwave Systems & Integrated antenna 3D integration design and analysis ICs packaging Systems Testing & Reliability (STR) : Analog, digital, mixed, and RF circuits testing SoC, MPSoC, NoC, SIP, and NIP test On-line Testing and fault Tolerance Defect and Fault Modeling MEMS, NEMS and MOEMS Testing 3D testing Delay testing DFT, BIST and BISR Fault Simulation, ATPG Yield Optimization Memory & FPGA Test and Repair Automotive reliability and test Reliability failures and modeling Electronic System Reliability Test and Security Issues ATE issues Alternatives test strategies Nano Electronic Systems (NES) : Nanostructured / nanoporous Materials and devices Nano-circuits and Nano-architectures Nano-sensors and Actuators Nanorobotics and Nano-manipulation Modeling and Simulation at the Nanoscale Carbon Nanostructures and devices Microfluidics and Nanofluidics Systems 3D printing systems Polymer Nanotechnology Nanoscale Materials Characterization Sensors based on emerging devices Renewable Energy Technologies Smart Grid Measurement of health risk Aerospace and Vehicle Manufacturers VLSI IoT Devices (IoT) : Ultra-low power VLSI design for IoT System on Chip for IoTs IoT Application oriented Technologies IoT communication systems Real-time IoT systems RFID systems IoT Services and Applications IoT nodes architectures Sensors and Actuators for IoT Power and Energy systems design for IoT nodes Connectivity for IoT Computing Platforms for IoT Data Acquisition, Storage and Management for IoT Security and Privacy Enhancing Technologies for IoT devices IoT System Interfaces Reliability of IoT VLSI

## Related conferences

- IEEE-NANO — IEEE International Conference on Nanotechnology — https://www.myhuiban.com/conference/4336
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- ICSUMMIT — International Conference on Sustainable Micro-Nano Materials & Innovative Technology — https://www.myhuiban.com/conference/5873
- ICDIS' — International Symposium on Integrated Circuit Design and Integrated Systems — https://www.myhuiban.com/conference/5569
- SIGIR — International Conference on Research and Development in Information Retrieval — https://www.myhuiban.com/conference/141

## Related journals

- IEEE Design & Test — https://www.myhuiban.com/journal/1162
- IEEE Micro — https://www.myhuiban.com/journal/17
- Nano Energy — https://www.myhuiban.com/journal/1111
- Nano Communication Networks — https://www.myhuiban.com/journal/403
- Nano Today — https://www.myhuiban.com/journal/1112

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Source: Conference Partner — https://www.myhuiban.com/conference/3173 (rankings reproduced from CCF / ICORE / QUALIS; data cached up to 1 hour)