# IIRW — IEEE International Integrated Reliability Workshop

- **Submission deadline**: 2026-09-04
- **Conference date**: 2026-10-04
- **Location**: South Lake Tahoe, California, USA
- **Conference Partner Index**: 52.3/100 (ranked #1157, confidence 0.45, algorithm 1.1) — how this is computed: https://www.myhuiban.com/ranking
- **Trackers**: 0
- **Attendees**: 0
- **Canonical page**: https://www.myhuiban.com/conference/1974

## Past editions

| Year | Deadline | Conference date | Location |
|---|---|---|---|
| 2016 | 2016-07-25 | 2016-10-09 | Stanford Sierra, California, USA |

## Call for papers

Scope IIRW 2026 welcomes abstracts on, but not limited to, these topics: Special Focus Areas: Power Electronic Reliability (SiC, GaN, PMICs) Circuit and Systems Reliability (telemetry, SoC) Heterogeneous Integration/3DIC (TSV and stacking package) Device-Level Reliability FET, FinFET, SOI, III-V, SiGe reliability (HCI, BTI, TDDB, RTN, etc.) FEOL/MOL/BEOL dielectrics (high-k, SiO2, SiON, low-k) RF and mm/sub-mm Wave devices and circuits reliability Reliability Characterization & Testing Wafer-level reliability tests for monitoring and qualification Plasma-induced damage (PID), electrostatic discharge (ESD), Failure analysis Modeling and simulation for reliability, including self-heating Process integration and advanced packaging reliability Circuit, System, and Application-Level Reliability Design-in-reliability (products, circuits, systems, processes) Reliability of advanced automotive circuits, systems, products Customer/manufacturer product reliability requirements Memory Reliability Conventional and emerging memories: Flash, DRAM, SRAM Emerging non-volatile memories: RRAM, PCM, FeFETs, ferroelectric capacitors Reliability and physics of memory switching, cycling endurance, retention, and variability Memory-centric aging mechanisms and failure modes Reliability in memory-based computing architecture

## Related conferences

- SIGIR — International Conference on Research and Development in Information Retrieval — https://www.myhuiban.com/conference/141
- AAAI — AAAI Conference on Artificial Intelligence — https://www.myhuiban.com/conference/408
- CVPR — IEEE Conference on Computer Vision and Pattern Recognition — https://www.myhuiban.com/conference/407
- ICRA — International Conference on Robotics and Automation — https://www.myhuiban.com/conference/421
- IJCAI — International Joint Conference on Artificial Intelligence — https://www.myhuiban.com/conference/405

## Related journals

- IEEE Transactions on Reliability — https://www.myhuiban.com/journal/1104
- Robotics and Computer-Integrated Manufacturing — https://www.myhuiban.com/journal/734
- Microelectronics Reliability — https://www.myhuiban.com/journal/404
- IEEE Transactions on Multimedia — https://www.myhuiban.com/journal/152
- Knowledge-Based Systems — https://www.myhuiban.com/journal/227

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Source: Conference Partner — https://www.myhuiban.com/conference/1974 (rankings reproduced from CCF / ICORE / QUALIS; data cached up to 1 hour)