# ITC — International Test Conference

- **Submission deadline**: 2026-03-20
- **Notification date**: 2026-06-19
- **Conference date**: 2026-10-11
- **Location**: San Antonio, Texas, USA
- **Rankings**: CCF B · CORE A · QUALIS A1
- **Conference Partner Index**: 89.1/100 (ranked #80, confidence 1.00, algorithm 1.1) — how this is computed: https://www.myhuiban.com/ranking
- **Trackers**: 24
- **Attendees**: 0
- **Canonical page**: https://www.myhuiban.com/conference/1488

## Acceptance history

| Year | Submitted | Accepted | Rate |
|---|---|---|---|
| 2025 | 164 | 40 | 24.4% |
| 2024 | 155 | 36 | 23.2% |
| 2023 | 162 | 30 | 18.5% |
| 2014 | 250 | 62 | 24.8% |
| 2013 | 250 | 46 | 18.4% |
| 2012 | 250 | 61 | 24.4% |

## Call for papers

ITC invites submissions on the latest advances in test, validation, diagnosis, implementation, and scalability for ICs, boards, and systems, covering cross-domain, test economics, and product lifecycle challenges. Topics of interest include, but not limited to Test Methodologies & Technologies • Adaptive Test in Practice • ATE & Probe Card Design • Built-In Self-Test (BIST) • Boundary Scan & JTAG • Design for Test (DFT) & DFM • Mixed-Signal & Analog Test • Memory Test & Repair • MEMS Testing • Power Issues in Test • High-Speed I/O, RF & Jitter Test • Test Compression & Optimization • Test Generation & Validation Industrial Case Study, System, & Application Specific Test • 3D/2.5D & Advanced Packaging • SoC/NoC Test • 5G/6G Test • Hardware Security & Trust • Automotive Test • IoT Test • System Test • Silicon case studies Verification, Debug & Analysis • Pre-Silicon/Post-Silicon Verification • Silicon Debug & Field Monitoring • Diagnosis & Defect Analysis • Data-Driven Test & End-to-End Analytics • Yield Analysis & Optimization • Test-to-Design Feedback & Escape Analysis Emerging Topics • Reliability & Resilience • Emerging Defect Mechanisms • Protocol-Aware Test • Optics & Photonics Test • AI/Machine Learning in Test • Quantum Device Testing • KGD/KGS/KGP Economics • New Technologies & Standards

## Related conferences

- ITC'' — International Conference on Information and Communication Technology for Embedded Systems — https://www.myhuiban.com/conference/1142
- ITC-Asia — International Test Conference in Asia — https://www.myhuiban.com/conference/4534
- ITC' — International Teletraffic Congress — https://www.myhuiban.com/conference/1348
- ITC-CSCC — International Technical Conference on Circuits/Systems, Computers and Communications — https://www.myhuiban.com/conference/1867
- ICRA — International Conference on Robotics and Automation — https://www.myhuiban.com/conference/421

## Related journals

- IEEE Design & Test — https://www.myhuiban.com/journal/1162
- Software & Systems Modeling — https://www.myhuiban.com/journal/99
- Pattern Recognition — https://www.myhuiban.com/journal/198
- IEEE Transactions on Neural Networks and Learning Systems — https://www.myhuiban.com/journal/188
- Information Sciences — https://www.myhuiban.com/journal/115

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Source: Conference Partner — https://www.myhuiban.com/conference/1488 (rankings reproduced from CCF / ICORE / QUALIS; data cached up to 1 hour)