# ETS — European Test Symposium

- **Submission deadline**: 2026-12-08
- **Notification date**: 2027-02-19
- **Conference date**: 2027-05-24
- **Location**: London, UK
- **Rankings**: CCF C · CORE B · QUALIS B2
- **Trackers**: 37
- **Attendees**: 3
- **Canonical page**: https://www.myhuiban.com/conference/1485

## Past editions

| Year | Deadline | Conference date | Location |
|---|---|---|---|
| 2026 | 2025-12-01 | 2026-05-25 | Chania, Greece |

## Call for papers

Areas of Interest The areas of interest include, but are not limited to, the following topics: T1 – Dependable AI and AI for Testing T2 – Functional Safety, Fault Tolerance and Reliability T3 – Methods for Emerging Technologies and Architectures T4 – Security and Trust T5 – Test and Reliability for Analog, Mixed-Signal, and RF T6 – DFT, Test Access Standards and Test Application T7 – Validation, Verification, and Debug T8 – Test Generation, Fault Modelling & Simulation, Diagnosis

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## Related journals

- IEEE Design & Test — https://www.myhuiban.com/journal/1162
- Knowledge-Based Systems — https://www.myhuiban.com/journal/227
- Future Generation Computer Systems — https://www.myhuiban.com/journal/36
- Neurocomputing — https://www.myhuiban.com/journal/234
- Pattern Recognition Letters — https://www.myhuiban.com/journal/236

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Source: Conference Partner — https://www.myhuiban.com/conference/1485 (rankings reproduced from CCF / ICORE / QUALIS; data cached up to 1 hour)
