Published since 1969, Microelectronics Journal is an international forum for the dissemination of research into, and applications of, microelectronics. Papers published in Microelectronics Journal have undergone peer review to ensure originality, relevance and timeliness. The journal thus provides a worldwide, regular and comprehensive update on microelectronics.

Microelectronics Journal invites significant research and application papers in all the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered.

Microelectronics Journal covers circuits and systems. This includes, but is not limited to:

• Analogue, digital, mixed, and RF circuit design methodologies
• Logic, architectural and system level synthesis
• Testing, design for testability, built in self-test
• Area, power and thermal evaluation
• Mixed-domain simulation and design
• Formal verification
• Embedded systems
• Design and test aspects of high density integration (3D, etc.)
• SoC, NoC, SIP, NIP design and test
• Emerging devices as FinFETs, SETs, etc.

Application aspects such as signal and image processing including circuits for cryptography, sensor and actuator design including sensor networks, reliability and quality issues, and economic models are also welcome.