Conference Information
ATS 2022: Asian Test Symposium
https://ats2022.ee.nthu.edu.tw/Submission Date: |
2022-07-01 |
Notification Date: |
2022-08-05 |
Conference Date: |
2022-11-21 |
Location: |
Taichung, Taiwan |
Years: |
31 |
CCF: c Viewed: 17554 Tracked: 16 Attend: 0
Call For Papers
Overview The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing, and field consideration in mind. Scope Topics of interest include (but are not limited to): Analog/Mixed-Signal Test Automatic Test Generation Board Test and Diagnosis Boundary Scan Test Built-In Self-Test (BIST) Connectivity Testing Defect-Based Test Delay and Performance Test Dependability and Functional Safety Design for Test (DFT) Diagnosis and Silicon Debug Economic of Test Failure Analysis Fault Modeling and Simulation Fault Tolerance GPU Test Hardware-Oriented Security and trust High-Speed I/O Test Low-Power IC Test Machine Learning in Test Memory Test and Repair Multi-/Many-core Processor Test Online Test Power/Thermal/Reliability Issues in Test Reconfigurable System Test RF Test Self-Repair SiP, Stacked, 3D IC Test Standards in Test Test Compression Test for Biomedical Circuits and Systems Test for MEMS and Microfluidic Systems Test for Nanoscale Devices and Emerging Technologies Test for Reversible and Quantum Circuits Test for Sensors and IoT Test Quality Test Synthesis Validation and Verification Yield Analysis and Enhancement
Last updated by Dou Sun in 2022-06-19
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Journal of Combinatorial Theory, Series B | 1.317 | Elsevier |
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